The KPM Analytics team will be at the JTIC event in Tours, France, November 23-24.  

Join us at booth #18  to learn about our solutions to help you measure quality where it matters, including:

  • Quickly analyze flour, wheat and by-products, in-line or in the lab: SpectraStar™ XT-F NIR analyzer
  • Determine dimensions, defects, colors of finished product in the bread lab: vision inspection solution TheiaVu™
  • Measure dough characteristics during kneading as well as protein and starch quality: Mixolab 2 analyzer

Click here to arrange a meeting time with one of our experts.

We are looking forward to seeing you!

Media contact: Melanie Scott
Email: mscott@kpmanalytics.com
Phone: +1 314-704-0053

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