Moisture & Compositional

SpectraStar™ XT-F Benchtop NIR

SpectraStar™ XT-F Benchtop NIR
SpectraStar™ XT-F Benchtop NIR

Product Overview

Complete Package for Accurate Analysis of Flour, Wheat, and By-Products

Designed for the milling and baking industries, the SpectraStar™ XT-F is the complete analyzer package for accurate analysis of flour, wheat, and by-products at-line or in a lab setting in under one minute. With a sealed case and touch screen operation, the SpectraStar™ XT-F is a ready-to-use solution for millers and bakers to test incoming wheat quality, monitor tempering processes, evaluating process streams to ensure optimal milling conditions, qualify raw ingredients, and more.

Advantages for Millers:

  • Rapid analysis of incoming and tempered wheat ensures grain is of the expected grade
  • In-process testing of milling streams increases flour yield and provides accurate data to optimize blends for grade specifications
  • Finished product testing ensures compliance with end-user requirements

Advantages for Bakers:

  • Test incoming and in-process raw ingredients for both compositional and functional properties (water absorption, starch damage, and rheological properties)
  • Ensure consistent composition and quality, leading to fewer production issues and higher quality final products

All SpectraStar™ XT analyzers are operated by UScan™, a software package incorporating an intuitive graphical interface and a reliable SQL database for data management. Designed for ease of use, routine operators can be completely trained in 15 minutes to deliver accurate, operator-independent results.

The SpectraStar™ XT patented TRUE ALIGNMENT® Spectroscopy (TAS) is an easy-to-use technology to precisely align and monitor the instrument calibration to certified optical standards for reliable results over time and across analyzers.

Unity Scientific SpectraStar™ XT
Unity Scientific SpectraStar™ XT
Unity Scientific SpectraStar™ XT UScan Software
Unity Scientific SpectraStar™ XT-F Benchtop NIR Analyzer
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Features

  • Access an extensive library of robust calibrations developed from hundreds-to-thousands of samples to validate incoming ingredients or grab-samples for important quality parameters
  • Stand-alone design with built-in computer for easy implementation
  • Sealed case for use at-line in production environments
  • Designed for ease-of-use; only minimal training required for routine operators
  • Advanced sample management and reporting features makes the analyzer lab-ready
  • Sealed case with 17” touch screen monitor for easy operation in laboratories or at-line on the production floor
  • Windows®10 Professional computer with SSD provides easy integration into computer networks

Benefits

  • Obtain vital quality parameter data in about 30 seconds, enabling quick response for quality control
  • Analyze fibers, sugars, fatty acids, starch, and other difficult constituents, as well as moisture, protein, and ash
  • Easy-to-use with graphical interface and modular configuration, requiring minimal training for routine operators
  • Minimal sample preparation required
  • Environmentally friendly; requires minimal energy use with no hazardous chemicals or waste
  • Save costs and reduce waste, which improves your company’s bottom line
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Applications

Optimize the Milling Process and Qualify Incoming Ingredients for Baked Goods

Applications for Benchtop NIR Analysis

Whether you are analyzing ingredient quality and supporting claims, ensuring proper batch or continuous processing conditions, or verifying a final product for quality, label, or specification claims, the SpectraStar™ XT-F NIR Analyzer will do the job. Each SpectraStar™ XT-F is a stand-alone unit in a small form factor for easy placement in nearly any quality lab or production setting.

SpectraStar™ XT-F NIR Analyzer customers use the system to measure quality parameters in a variety of products, including:

Flour, Wheat & By-Products

  • Test incoming wheat quality
  • Monitor tempering processes
  • Evaluate process streams to ensure optimal milling conditions
  • Monitor ash content to optimize extraction and increase production
  • Validate final flour quality
  • Test quality of milling by-products
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SpectraStar™ XT-F Benchtop NIR

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How It Works

Advanced Sample Management and Reporting

The SpectraStar™ XT-F NIR Analyzers utilize scanning monochromator technology for the highest signal quality available. These systems utilize near-infrared light and precisely measure absorbance at each wavelength. Robust calibrations transform this spectral information into multiple constituent values that cannot be quantified through visual inspection. These systems are designed for flexibility, ease-of-use, and speed, as samples can be analyzed in less than one minute.

  1. Select or verify your product type
  2. Fill your sample cup and place on the instrument
  3. Press start and your results are displayed in about 30 seconds
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System Components

  • SpectraStar™ XT-F NIR Analyzer unit for accurate analysis of wheat, flour, and by-products
  • Built-in Windows® 10 computer with 17" touch screen
  • UScan™ software
  • Multi cup adapter
  • ISI ring cup/powder cup adapter
  • TRUE ALIGNMENT Spectroscopy (TAS) standards
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Calibrations

Calibrations

SpectraStar™ XT-F is delivered complete with calibrations needed to optimize the milling process and qualify incoming ingredients for baked goods.

These calibrations include:

  • Whole wheat kernels (moisture and protein)
  • Ground wheat- By-products, such as midds and red dog (moisture, protein, and fiber)
  • Finished flour (moisture, protein, ash, water absorption, starch damage, rheological parameters)

Additional Unity calibrations for single product type, moisture, protein, and/or oil are also available. Contact us today for a list of available products.

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Software

The SpectraStar Analyzers are operated by UScan™, a software package incorporating an intuitive graphical interface and a reliable SQL database for data management. Designed for ease-of-use, routine operators can be completely trained in 15 minutes to deliver accurate, operator-independent results.

The SpectraStar Analyzers are operated by UScan™, a software package incorporating an intuitive graphical interface and a reliable SQL database for data management. Designed for ease-of-use, routine operators can be completely trained in 15 minutes to deliver accurate, operator-independent results.

The SpectraStar Analyzers are operated by UScan™, a software package incorporating an intuitive graphical interface and a reliable SQL database for data management. Designed for ease-of-use, routine operators can be completely trained in 15 minutes to deliver accurate, operator-independent results.

The SpectraStar Analyzers are operated by UScan™, a software package incorporating an intuitive graphical interface and a reliable SQL database for data management. Designed for ease-of-use, routine operators can be completely trained in 15 minutes to deliver accurate, operator-independent results.

As an option, users can take advantage of the CommUnity software platform, which allows for remote management, monitoring, and reporting capabilities for managing a computer network of SpectraStar XT analyzers.

As an option, users can take advantage of the CommUnity software platform, which allows for remote management, monitoring, and reporting capabilities for managing a computer network of SpectraStar XT analyzers.

As an option, users can take advantage of the CommUnity software platform, which allows for remote management, monitoring, and reporting capabilities for managing a computer network of SpectraStar XT analyzers.

As an option, users can take advantage of the CommUnity software platform, which allows for remote management, monitoring, and reporting capabilities for managing a computer network of SpectraStar XT analyzers.

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Accessories

SpectraStar™ XT-F Benchtop NIR

Available Accessories

  • Cups of varying sizes, including options with plungers and a sample ring
  • CommUnity™ instrument license (1 year)
  • Moisture oven for reference measurement
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Specifications

The SpectraStar™ XT-F is a complete analyzer package for the analysis of flour and wheat. The XT-F includes a sample cup and calibrations for flour, whole wheat, whole wheat seeds and by-products.

SpectraStar™ XT-F

Dimensions Width x Depth x Height: 39 x 53 x 64 cm (15.5 x 21 x 25 in.)
Weight 22.0 kg (48 lbs)
Power Less Than 120-240 VAC, Frequency 50-60 Hz
Analysis Time 10 – 60 Seconds
Detectors High-Performance Ultra-Cooled InGaAs Extended Range Detector
Light Source Tungsten Halogen Lamp with MTBF Rating of 10,000 Hours, User Changeable
Optical Bandwidth 10.0 ± 0.3 nm actual FWHM
Absorbance Range Up to 3 AU
Measurement Mode Reflectance
Wavelength Range 1400 – 2600 nm
Wavelength Accuracy Less Than 0.02 nm to Traceable Standard Reference Material
Wavelength Precision Less Than 0.005 nm
Number of Data Points 1200
Photometric Noise Full Range Less Than 20 µAu
Instrument Case Powder Coated Aluminum, Completely Sealed, No Venting or Fan
ISO 12099 Compliant Animal Feedstuffs, Cereals, and Milled Products – Guidelines for the Application of Near Infrared Spectrometry
Built-in Computer Windows® 10 Professional, SSD
Networking LIMS Compatible, HDMI Port, 4 USB Ports
Ambient Temperature 0 – 40°C (32 – 104°F)
Ambient Humidity Less Than 95% RH, Less Than 85% RH Recommended
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